The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 08, 2007
Filed:
Aug. 05, 2004
Applicants:
Keerthinarayan P. Heragu, Richardson, TX (US);
Patrick Bosshart, Plano, TX (US);
Inventors:
Keerthinarayan P. Heragu, Richardson, TX (US);
Patrick Bosshart, Plano, TX (US);
Assignee:
Texas Instruments Incorporated, Dallas, TX (US);
Primary Examiner:
Int. Cl.
CPC ...
H03L 7/06 (2006.01);
U.S. Cl.
CPC ...
Abstract
The disclosed invention provides methods and systems for writing and reading data in systems using multiple FIFO buffer elements. For each buffer element, a determination is made of when the rising edge of the read clock occurs during the second half of the write clock cycle. Responsive to this determination, the data written into the FIFO buffer element is shifted in order to reduce skew.
Heragu, Keerthinarayan. (2007). Methods and systems to reduce data skew in fifos (U.S. Patent No. 7216247). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7216247
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile