The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 08, 2007
Filed:
Jun. 13, 2006
Dan Vacar, San Diego, CA (US);
David K. Mcelfresh, San Diego, CA (US);
Kenny C. Gross, San Diego, CA (US);
Leoncio D. Lopez, Escondido, CA (US);
Dan Vacar, San Diego, CA (US);
David K. McElfresh, San Diego, CA (US);
Kenny C. Gross, San Diego, CA (US);
Leoncio D. Lopez, Escondido, CA (US);
Sun Microsystem, Inc., Santa Clara, CA (US);
Abstract
A system that characterizes degradation of a component in a system. During operation, the system monitors inferential variables associated with a specimen of the component. Next, the system determines a time for the onset of degradation for the specimen and determines a time for the completion of degradation for the specimen. The system then computes a time interval between the onset of degradation and the completion of degradation, and uses the time interval to look up an entry in a defect library to obtain information which characterizes the degradation of the specimen of the component.