The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 08, 2007

Filed:

Jun. 02, 2004
Applicants:

Jing Liu, Boulder, CO (US);

Jon James Anderson, Boulder, CO (US);

Kurt William Otte, Erie, CO (US);

Inventors:

Jing Liu, Boulder, CO (US);

Jon James Anderson, Boulder, CO (US);

Kurt William Otte, Erie, CO (US);

Assignee:

Qualcomm, Incorporated, San Diego, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04Q 7/20 (2006.01);
U.S. Cl.
CPC ...
Abstract

Techniques for scanning other frequency channels for candidate base stations are described. In one scheme, the scanning of other frequency channels is performed based on the received signal quality (e.g., pilot Ec/Io) for an active base station that a wireless device is monitoring for user-specific and overhead messages. The scanning is bypassed if the active pilot Ec/Io exceeds a high threshold and performed if the active pilot Ec/Io is between the high threshold and a low threshold. In another scheme, the scanning of other frequency channels is performed at a rate that is a function of the active pilot Ec/Io. In yet another scheme, the scanning of other frequency channels is performed based on the active pilot Ec/Io and further using an adaptive timer. The timer is set to an initial value and thereafter adjusted by variable amounts determined by active pilot Ec/Io measurements.


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