The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 08, 2007
Filed:
Sep. 30, 2004
Zhye Yin, Schenectady, NY (US);
Jong Chul YE, Daejon, KR;
Francis Howard Little, Cincinnati, OH (US);
Forrest Frank Hopkins, Scotia, NY (US);
Michael Chunhe Gong, Chicago, IL (US);
Yanfeng Du, Rexford, NY (US);
Zhye Yin, Schenectady, NY (US);
Jong Chul Ye, Daejon, KR;
Francis Howard Little, Cincinnati, OH (US);
Forrest Frank Hopkins, Scotia, NY (US);
Michael Chunhe Gong, Chicago, IL (US);
Yanfeng Du, Rexford, NY (US);
General Electric Company, Niskayuna, NY (US);
Abstract
A method for reconstructing image data from measured sinogram data acquired from a CT system is provided. The CT system is configured for industrial imaging. The method includes pre-processing the measured sinogram data. The pre-processing includes performing a beam hardening correction on the measured sinogram data and performing a detector point spread function (PSF) correction and a detector lag correction on the measured sinogram data. The pre-processed sinogram data is reconstructed to generate the image data.