The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 08, 2007
Filed:
Nov. 26, 2001
Roel Van Woudenberg, Eindhoven, NL;
Roel Van Woudenberg, Eindhoven, NL;
Koninklijke Philips Electronics N. V., Eindhoven, NL;
Abstract
A multi-layer record carrier and method of manufacturing thereof and recording thereon, includes data written in units of blocks on tracks of at least two information layers. A first guard field is written at the start of a data block and a second guard field is written at the end of the data block. The power in the focused spot in the deepest of the at least two information layers is maintained substantially at an optimal value, by setting the length of the first and second guard fields such that the end position of the second guard field of a preceding data block is located within the area of the first guard field of the succeeding data block. Thereby, gap portions between the first and second guard fields can be prevented. Alternatively, the length of the first and second guard fields is set to be approximately equal to the sum of half the diameter of a recording beam in the upper one of the at least two information layers when focused on the lowest one of the at least two information layers and a maximum allowed misalignment between the two layers. Thereby, the area through which the beam passes in the information layer is of a uniform nature, when user data is being read or written. The at least two information layers are aligned by optically measuring and aligning alignment marks, such as header spokes, at predetermined measuring points.