The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 08, 2007
Filed:
Jul. 21, 2005
Craig E. Borden, Placentia, CA (US);
Chih-shun Ding, Austin, TX (US);
Steve Majors, Austin, TX (US);
Mishel Matloubian, Irvine, CA (US);
Craig E. Borden, Placentia, CA (US);
Chih-Shun Ding, Austin, TX (US);
Steve Majors, Austin, TX (US);
Mishel Matloubian, Irvine, CA (US);
Mindspeed Technologies, Inc., Newport Beach, CA (US);
Abstract
A semiconductor die includes at least one process monitoring circuit for evaluating at least one process parameter of the semiconductor die. The at least one process monitoring circuit can include a first group of process monitoring circuits for monitoring NFET speed and a second group of process monitoring circuits for monitoring PFET speed. The process monitoring circuits can be distributed at the corners of the semiconductor die. The semiconductor die further includes a voltage control circuit configured to store optimum voltage information corresponding to the at least one process parameter. The voltage control circuit is further configured to selectively provide the optimum voltage information to a system power supply. The voltage control circuit includes a calculated optimum voltage register that stores the optimum voltage information corresponding to the at least one process parameter.