The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 08, 2007
Filed:
Mar. 30, 2006
Emad Andarawis Andarawis, Ballston Lake, NY (US);
Samhita Dasgupta, Niskayuna, NY (US);
Shobhana Mani, Clifton Park, NY (US);
Weiguo Chen, Shanghai, CN;
Emad Andarawis Andarawis, Ballston Lake, NY (US);
Samhita Dasgupta, Niskayuna, NY (US);
Shobhana Mani, Clifton Park, NY (US);
Weiguo Chen, Shanghai, CN;
General Electric Company, Niskayuna, NY (US);
Abstract
A multi tip clearance measurement system is provided. The clearance measurement system includes a sensor disposed on a first object, wherein the sensor comprises a plurality of probe tips configured to generate signals representative of a sensed parameter corresponding to a second object and a processing unit configured to evaluate the signals from subsets of the sensed parameters from the probe tips to detect an outlier probe tip and to adjust a gain, or an offset of the respective outlier probe tip for estimating the clearance between the first and second objects based upon the signals.