The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 08, 2007
Filed:
Oct. 07, 2002
David John Buttle, Wantage, GB;
David John Buttle, Wantage, GB;
ESR Technology Ltd., Warrington, GB;
Abstract
Material properties such as stress in a ferromagnetic material may be measured using an electromagnetic probe. While generating an alternating magnetic field in the object, and sensing the resulting magnetic field with a sensor, the signals from the magnetic sensor may be resolved into in-phase and quadrature components. The signals are affected by both geometrical parameters such as lift-off and by material properties, but these influences may be separated by mapping the in-phase and quadrature components directly into material property and lift-off components, and hence a material property and/or the lift-off may be determined. The mapping may be represented in the impedance plane as two sets of contours representing signal variation with lift-off (A) (for different values of stress) and signal variation with stress (B) (for different values of lift-off), the contours of both sets (A, B) being curved. The stress contours (B) intersect any one liftoff contour (A) at a constant angle. Hence calibration measurements taken along a few contours of each set enable the positions of the other contours of each set to be determined.