The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 08, 2007

Filed:

Jan. 29, 2004
Applicant:

Thomas Schopp, Freiburg, DE;

Inventor:

Thomas Schopp, Freiburg, DE;

Assignee:

Sick AG, Waldkirch, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/86 (2006.01); G01N 21/88 (2006.01); G01V 8/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for operating an optical sensor for measuring a physical quantity with a defined scale value that is subject to a calibration certification. The measurement accuracy of the quantity being measured is dependent on at least one external condition, and a given scale value is used for the measurement according to the desired measurement accuracy. The scale value is appropriately changed when the measurement accuracy changes due to a change of external condition. An optoelectronic sensor has a switching arrangement for changing the scale value. The sensor is more diversified and can cover larger measurement ranges without requiring new certifications or authorizations for the different measurement ranges.


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