The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 08, 2007

Filed:

Jun. 21, 2005
Applicants:

Haeng Seok Yang, Gyeonggi-do, KR;

Dong Ho Shin, Seoul, KR;

Kwan Young OH, Gyeonggi-do, KR;

Jun Won an, Gyeonggi-do, KR;

Sang Kyeong Yun, Gyeonggi-do, KR;

Inventors:

Haeng Seok Yang, Gyeonggi-do, KR;

Dong Ho Shin, Seoul, KR;

Kwan Young Oh, Gyeonggi-do, KR;

Jun Won An, Gyeonggi-do, KR;

Sang Kyeong Yun, Gyeonggi-do, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03B 21/26 (2006.01); G03B 21/14 (2006.01); G02B 27/10 (2006.01); G02B 27/42 (2006.01); G02B 5/18 (2006.01);
U.S. Cl.
CPC ...
Abstract

A color display device is disclosed. The color display device includes an illumination lens system, a diffractive light modulation system, a combining system, a Fourier filter system, and a projection system. The illumination lens system converts a plurality of light beams into linear parallel light beams. The diffractive light modulation system produces a plurality of diffracted light beams having a plurality of diffraction orders by modulating each of the plurality of parallel light beams that are almost perpendicularly incident from the illumination lens system, The combining system focuses the plurality of diffracted light beams having the plurality of diffraction orders. The Fourier filter system selects diffracted light beams having desired diffraction orders using a dichroic filter. The projection system focuses the diffracted light beams on an object, and allowing the focused diffracted light beams to scan the object.


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