The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 08, 2007
Filed:
Feb. 11, 2003
Jeffrey Jonathan Persoff, San Jose, CA (US);
Jeffrey Jonathan Persoff, San Jose, CA (US);
Visx, Incorporated, Santa Clara, CA (US);
Abstract
The present invention provides methods and devices for calibrating an optical wavefront system. The calibration devices of the present invention can include a body which has a proximal portion and a distal portion. A pupil can be positioned on the proximal portion of the body to aperture light. A target can be positioned on the distal portion of the body so as to reflect light back through the pupil and into the wavefront system. If the device has a lens assembly or a phase plate, the reflected light can pick up known aberrations or defocus characteristics from the lens assembly before it enters the calibration device. The known wavefront characteristic can be compared to the wavefront measurement obtained by the wavefront system to aid in calibrating the wavefront system.