The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 08, 2007
Filed:
Nov. 21, 2005
Applicants:
Jacques Hoffmann, Lincolnwood, IL (US);
David J. Balke, Morton Grove, IL (US);
Peter Davey, Oxford, GB;
Inventors:
Jacques Hoffmann, Lincolnwood, IL (US);
David J. Balke, Morton Grove, IL (US);
Peter Davey, Oxford, GB;
Assignee:
Intertech Development, Skokie, IL (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01F 25/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A leak test arrangement having a leak calibration device is disclosed. The calibration device is connected into communication with the leak test arrangement and provides a controlled source (sink) of fluid at a predetermined amount. The calibration includes a substantially sealed volume of fluid in fluid communication with the test arrangement and a control arrangement for heating and/or cooling the volume to produce the source (sink) of the calibrator.