The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 01, 2007
Filed:
May. 09, 2003
Hakan Jakobsson, San Francisco, CA (US);
William Mckenna, Santa Cruz, CA (US);
Mohamed Ziauddin, Pleasanton, CA (US);
Hakan Jakobsson, San Francisco, CA (US);
William McKenna, Santa Cruz, CA (US);
Mohamed Ziauddin, Pleasanton, CA (US);
Oracle International Corporation, Redwood Shores, CA (US);
Abstract
Described herein are approaches to implementing dynamic sampling in a way that lessens or eliminates the additional overhead incurred to perform dynamic sampling. Also described are techniques for determining characteristics about predicates not previously determined by conventional techniques for dynamic sampling. Dynamic sampling is used by a query optimizer to dynamically estimate predicate selectivities and statistics. When a database statement is received by a database server, an initial analysis of the database statement is made to determine the efficacy of dynamic sampling, that is, to determine whether optimization of the query would benefit from dynamic sampling and whether performance is not excessively impacted by the dynamic sampling process. If this analysis determines dynamic sampling should be used, then dynamic sampling is undertaken.