The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 01, 2007
Filed:
Apr. 04, 2003
Masayoshi Ishikawa, Hamamatsu, JP;
Takane Yokoi, Hamamatsu, JP;
Tsutomu Nakamura, Hamamatsu, JP;
Yutaka Ochiai, Hamamatsu, JP;
Kinji Takase, Hamamatsu, JP;
Masayoshi Ishikawa, Hamamatsu, JP;
Takane Yokoi, Hamamatsu, JP;
Tsutomu Nakamura, Hamamatsu, JP;
Yutaka Ochiai, Hamamatsu, JP;
Kinji Takase, Hamamatsu, JP;
Hamamatsu Photonics K.K., Shizuoka, JP;
Abstract
An initial image (the image of a slit plateimaged when adjusted to an optimal focal diameter) is stored in a storage sectionof an X-ray tube adjusting apparatus. An acquisition sectionacquires a test image (the image of the slit plateimaged at the time of adjusting the focal diameter). A presentation sectionpresents the initial image and an image representing the luminance on the initial image (showing a contrast Δa between a slit portionand a residual area portionin the initial image) and the test image and an image representing the luminance on the test image (showing a contrast Δb between a slit portionand a residual area portionin the initial image) simultaneously (in a comparable manner).