The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 01, 2007
Filed:
Jan. 03, 2003
Jyh-shin Pan, Hsin Chu Hsien, TW;
Chih-yuan Chen, Chang Hua Hsien, TW;
Jyh-Shin Pan, Hsin Chu Hsien, TW;
Chih-Yuan Chen, Chang Hua Hsien, TW;
Mediatek Inc., Hsin-Chu City, TW;
Abstract
An apparatus of detecting defects on an optical recording medium includes a defect signal generating circuit for generating a corresponding defect signal according to a surface defect of the optical recording medium, a first synchronous signal generator for generating a first synchronous signal, a defect signal locating circuit, a delay signal generating circuit, and an OR gate. The defect signal includes at least one pulse, whose width corresponds to the physical width of a surface defect. The delay signal generating circuit generates a delay signal corresponding to each pulse when the spacing between two adjacent pulses is smaller than a preset value. An OR operation is performed to the delay signal and the defect signal to obtain a defect extension signal. The first synchronous signal and a second synchronous signal for separating data recording sectors of the optical recording medium are employed to detect widths and addresses of surface defects.