The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 01, 2007
Filed:
Sep. 16, 2004
Applicants:
Thomas Weyh, Stadtroda, DE;
Ulrich Simon, Rothenstein, DE;
Guenter Schoeppe, Jena, DE;
Ralf Wolleschensky, Schoeten, DE;
Michael Stock, Apolda, DE;
Inventors:
Thomas Weyh, Stadtroda, DE;
Ulrich Simon, Rothenstein, DE;
Guenter Schoeppe, Jena, DE;
Ralf Wolleschensky, Schoeten, DE;
Michael Stock, Apolda, DE;
Assignee:
Carl Zeiss Jena GmbH, Jena, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/06 (2006.01);
U.S. Cl.
CPC ...
Abstract
A laser scanning microscope comprises at least one selectively switchable micro-mirror arrangement (DMD) in the illumination beam path and/or detection beam path which is used for the wavelength selection of dispersively divided illumination and/or object light such as reflection, fluorescence.