The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 01, 2007
Filed:
Jul. 09, 2004
Applicants:
Ralph Lange, Jena, DE;
Stefan Wilhelm, Jena, DE;
Ulrich Meisel, Jena, DE;
Matthias Reich, Jena, DE;
Inventors:
Assignee:
Carl Zeiss Jena GmbH, Jena, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/06 (2006.01);
U.S. Cl.
CPC ...
Abstract
An arrangement in the illumination beam path of a laser scanning microscope, comprising a mirror which can be introduced into the beam path for coupling in at least one additional wavelength, and a method for the operation of a laser scanning microscope with a mirror which can be swiveled in rapidly for coupling at least one additional wavelength into the illumination beam path, wherein the swiveling process is synchronized with the illumination control by a control unit in such a way that at least one additional wavelength is coupled into the illumination beam path when the mirror is swiveled out.