The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 01, 2007

Filed:

Oct. 26, 2004
Applicants:

Takushi Fujita, Kawasaki, JP;

Toru Kamiwada, Kawasaki, JP;

Takuya Sakamoto, Kawasaki, JP;

Inventors:

Takushi Fujita, Kawasaki, JP;

Toru Kamiwada, Kawasaki, JP;

Takuya Sakamoto, Kawasaki, JP;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 15/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A configuration is presented that enables viewing a plurality of data objects situated in a virtual space as the visual field defined in the virtual space is changed smoothly; and that at the same time enables: supplemental information in connection with displayed data objects to be displayed; information in connection with displayed data objects to be displayed in more detail; means for dialogue with a user to be provided in situations where required; and application programs linked to the display of information and associated with that information to be executed. Included are: a step of accepting virtual-viewpoint position changes; a step of continuously changing visual field based on the virtual-viewpoint position changes, and uninterruptedly changing the display of a data object positioned within the visual field; a step of determining whether a data object positioned within the visual field satisfies predetermined geometric conditions for the visual field; and in respect of a data object that satisfies the predetermined geometric conditions, a step of executing a process preset in that data object.


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