The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 01, 2007
Filed:
Sep. 07, 2004
Anand T. Krishnan, Farmers Branch, TX (US);
Srikanth Krishnan, Richardson, TX (US);
Vijay Reddy, Plano, TX (US);
Cathy Chancellor, Wylie, TX (US);
Anand T. Krishnan, Farmers Branch, TX (US);
Srikanth Krishnan, Richardson, TX (US);
Vijay Reddy, Plano, TX (US);
Cathy Chancellor, Wylie, TX (US);
Texas Instruments Incorporated, Dallas, TX (US);
Abstract
Methods and systems are provided for characterizing the negative temperature bias instability of a transistor. A bias voltage is maintained at a drain terminal of the transistor during a test period. A stress voltage is maintained at a gate terminal of the transistor during the test period, such that the stress voltage is applied concurrently with the bias voltage. At least one characteristic of the transistor is measured at periodic intervals during the stress period to determine a degradation of the at least one characteristic caused by the stress voltage until a termination event occurs.