The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 01, 2007
Filed:
Aug. 06, 2003
Applicants:
Arthur M. Brown, Brecksville, OH (US);
Eckhard Ficker, Cleveland, OH (US);
Barbara A. Wible, Cleveland, OH (US);
Inventors:
Arthur M. Brown, Brecksville, OH (US);
Eckhard Ficker, Cleveland, OH (US);
Barbara A. Wible, Cleveland, OH (US);
Assignee:
Chan Test, Inc., Cleveland, OH (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/53 (2006.01);
U.S. Cl.
CPC ...
Abstract
Disclosed are high throughput assay systems and methods for identifying agents that alter the level of surface expression of integral membrane proteins, such as cardiac ion channels, in mammalian cells. Also disclosed are therapeutic methods of using agents identified using such methods.
Quick Actions:
Brown, Arthur. (2007). High throughput assay systems and methods for identifying agents that alter surface expression of integral membrane proteins (U.S. Patent No. 7211407). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7211407
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile