The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 24, 2007
Filed:
Sep. 09, 2004
Applicants:
Terrence Barr, Freiburg, DE;
David Proulx, San Jose, CA (US);
Inventors:
Terrence Barr, Freiburg, DE;
David Proulx, San Jose, CA (US);
Assignee:
Sun Microsystems, Inc., Santa Clara, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method for testing performance of a constrained resources computing device (CRCD) is provided which includes determining that a data sample was generated and generating a time stamp corresponding to when the data sample was generated. The method also includes determining a defined time interval corresponding to the time stamp and incrementing a counter associated with the defined time interval corresponding to the time stamp.