The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 24, 2007

Filed:

Aug. 03, 2004
Applicants:

Alejandro P. Brott, Chicago, IL (US);

Dennis Thibedeau, Franklin, WI (US);

Inventors:

Alejandro P. Brott, Chicago, IL (US);

Dennis Thibedeau, Franklin, WI (US);

Assignee:

Snap-On Incorporated, Kenosha, WI (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 27/28 (2006.01); G01R 31/00 (2006.01); G01R 31/14 (2006.01); G06F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An active tester for vehicle circuit evaluation includes a signal source for generating a dynamic signal, such as an AC current, for injecting to a circuit under test. The tester includes a data storage device for storing at least one test parameter and a data processor for processing data. In operation, the data processor controls to apply the dynamic signal to the separated points of the circuit via the first set of terminals. The response of the circuit under test to the applied dynamic signal is measured. The data processor determines a dynamic parameter of the circuit under test as a function of the dynamic signal and the response. The data process then generates a test result related to the characteristics of the circuit as a function of the at least one test parameter and the determined dynamic parameter. The test result is compared with specification values to determine whether the circuit under test works normally.


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