The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 24, 2007

Filed:

May. 10, 2004
Applicant:

Takeshi Kobayashi, Kyoto, JP;

Inventor:

Takeshi Kobayashi, Kyoto, JP;

Assignee:

Horiba, Ltd., Kyoto, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01D 18/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An improved measuring apparatus includes a calibration-related data storage section for storing calibration-related data including, at least, user identifiers for identifying users who have calibrated the apparatus, and calibration date and time data indicative of the date and time of calibration. A display output section is operative to fetch data related to the latest calibration from the calibration-related data storage section by reference to the calibration date and time data and then display an indication of a user identified by a user identifier included in the data related to the latest calibration as a calibrator identifiably together with the measurement outcome.


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Kobayashi, Takeshi. (2007). Measuring apparatus with a validation capability of its previous calibration (U.S. Patent No. 7209847). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7209847

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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