The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 24, 2007
Filed:
Jul. 01, 2005
Kenji Tamaki, Kawasaki, JP;
Youichi Nonaka, Yokohama, JP;
Kenji Tamaki, Kawasaki, JP;
Youichi Nonaka, Yokohama, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
In a quality control system for manufacturing industrial products, the product quality history and the manufacturing process history are collected and collated to calculate the correlation magnitude between the two histories. The candidates for the cause of quality variation hidden in the manufacturing processes are listed, and the correlation magnitude between all combinations of the variates of the manufacturing process history are calculated. Further, by utilizing the manufacturing sequence history used for an input plan, a causation connecting structure model between the manufacturing processes of the manufacturing line is automatically generated and automatically analyzed thereby to automatically extract the fundamental cause of quality variation from the candidates for the cause of quality variation. By doing so, the cause of quality variation of industrial products manufactured through a complicated process can be traced in a complicated connecting structure in the manufacturing history data.