The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 24, 2007
Filed:
Apr. 14, 2005
John S. Agapiou, Rochester Hills, MI (US);
Eric A. Steinhilper, Harrison Township, MI (US);
Jeffrey M. Alden, Ypsilanti, MI (US);
Aloysius Anagonye, Southfield, MI (US);
Pulak Bandyopadhyay, Rochester Hills, MI (US);
Fangming Gu, Rochester Hills, MI (US);
Patrick M. Hilber, Rochester, MI (US);
John S. Agapiou, Rochester Hills, MI (US);
Eric A. Steinhilper, Harrison Township, MI (US);
Jeffrey M. Alden, Ypsilanti, MI (US);
Aloysius Anagonye, Southfield, MI (US);
Pulak Bandyopadhyay, Rochester Hills, MI (US);
Fangming Gu, Rochester Hills, MI (US);
Patrick M. Hilber, Rochester, MI (US);
GM Global Technology Operations, Inc., Detroit, MI (US);
Abstract
A multistage machining process includes a plurality of stations. Workpiece feature quality is predicted based on decomposition of the machining process into sources of variation, reticulation of the machining process into machining stations and error models that account for significant contributions to feature quality including from categorical sources of variation.