The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 24, 2007

Filed:

Feb. 14, 2005
Applicants:

Feng Niu, Weston, FL (US);

Spyros Kyperountas, Weston, FL (US);

Qicai Shi, Coral Springs, FL (US);

David B. Taubenheim, Plantation, FL (US);

Inventors:

Feng Niu, Weston, FL (US);

Spyros Kyperountas, Weston, FL (US);

Qicai Shi, Coral Springs, FL (US);

David B. Taubenheim, Plantation, FL (US);

Assignee:

Motorola, Inc., Schaumburg, IL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04Q 7/20 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus for determining the location of a node within a communication system is provided herein. During operation, reference nodes () having known locations are utilized to locate 'blind' nodes () whose location is to be determined. More particularly, a blind node () wishing to determine its location will measure a plurality of path losses between itself and a plurality of reference nodes (). These reference nodes' locations will then be mathematically weighted by the path loss between these reference nodes () and the blind node (). The location of the blind node () is a sum of the mathematically weighted reference nodes' locations.


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