The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 24, 2007

Filed:

Nov. 30, 2004
Applicants:

Petri Myllymäki, Helsinki, FI;

Petri Kontkanen, Helsinki, FI;

Teemu Roos, Helsinki, FI;

Kimmo Valtonen, Helsinki, FI;

Jussi Lahtinen, Helsinki, FI;

Hannes Wettig, Kulloonkylä, FI;

Antti Tuominen, Espoo, FI;

Henry Tirri, Helsinki, FI;

Inventors:

Petri Myllymäki, Helsinki, FI;

Petri Kontkanen, Helsinki, FI;

Teemu Roos, Helsinki, FI;

Kimmo Valtonen, Helsinki, FI;

Jussi Lahtinen, Helsinki, FI;

Hannes Wettig, Kulloonkylä, FI;

Antti Tuominen, Espoo, FI;

Henry Tirri, Helsinki, FI;

Assignee:

Ekahau Oy, Helsinki, FI;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04Q 7/20 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for determining an error estimate concerning a target device's location. The target device moves and communicates in a wireless environment using signals having at least one measurable signal value. A probabilistic model of the wireless environment indicates a probability distribution for signal values at several sample points in the wireless environment. A set of observations of signal values is made and the target device's location is estimated based on the probabilistic model and the set of observations. The error estimate is determined as a combination of products over several sample points. Each product comprises a probability distribution for the sample point in question being the target device's location and a distance function between the sample point in question and the target device's estimated location.


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