The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 24, 2007
Filed:
Mar. 28, 2005
Masato Koyanagi, Mishima, JP;
Tetsuya Kobayashi, Numazu, JP;
Shinya Yamamoto, Numazu, JP;
Kohei Matsuda, Shizuoka-ken, JP;
Shinichi Agata, Shizuoka-ken, JP;
Kentarou Kawata, Numazu, JP;
Yuji Moriki, Numazu, JP;
Masato Koyanagi, Mishima, JP;
Tetsuya Kobayashi, Numazu, JP;
Shinya Yamamoto, Numazu, JP;
Kohei Matsuda, Shizuoka-ken, JP;
Shinichi Agata, Shizuoka-ken, JP;
Kentarou Kawata, Numazu, JP;
Yuji Moriki, Numazu, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
A developing apparatus including: a developer carrying member for carrying a developer, the developer carrying member being provided with an elastic layer and adapted to develop, with a developer, an electrostatic image formed on an image bearing member; wherein the developer includes a toner, the toner has a shape factor SF-1 of 100 or more but less than 130, the toner has a storage modulus G' (140° C.) at 140° C. of 2.0×10dN/mor more but less than 2.0×10dN/m, the toner has a temperature, when the toner has a viscosity of 1.0×10Pa·s in a flow tester temperature elevation method, of 115° C. or more but less than 130° C., and, in a surface roughness of the developer carrying member, a center-line mean roughness Ra, a ten-point mean roughness Rz and a mean spacing Sm of irregularities satisfy following relationships (1):