The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 24, 2007

Filed:

Jun. 09, 2003
Applicants:

Keiichi Iwamura, Kanagawa, JP;

Kitahiro Kaneda, Kanagawa, JP;

Jun Tamaru, Tokyo, JP;

Takami Eguchi, Tokyo, JP;

Inventors:

Keiichi Iwamura, Kanagawa, JP;

Kitahiro Kaneda, Kanagawa, JP;

Jun Tamaru, Tokyo, JP;

Takami Eguchi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04K 1/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A document image undergoes document analysis to obtain circumscribing rectangles of characters (S), and two distances between non-neighboring circumscribing rectangles from the head of the document are respectively calculated as dand d(S). If information to be embedded is 1, one or a combination of a process for changing a parameter associated with the size of a circumscribing rectangle and a process for changing a parameter associated with the position of a circumscribing rectangle is executed to satisfy d>d(S). If information to be embedded is 0, one or a combination of the above two parameter change processes is executed to satisfy d<d(S).


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