The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 24, 2007
Filed:
Jun. 14, 2002
Edmun Chian Song Seng, Singapore, SG;
Uttheng Kan, Singapore, SG;
Edmun Chian Song Seng, Singapore, SG;
UttHeng Kan, Singapore, SG;
Seagate Technology LLC, Scotts Valley, CA (US);
Abstract
The thermal decay of data written to a magnetic mass storage medium is determined by measuring and analyzing the time-domain equalized-signal-to-noise ratio (ESNR) and equalized signal-to-total-distortion noise ratio (ESTDR) of written data. In some embodiments, a test track and a reference track are initialized from data. Subsequently, the reference track is re-initialized from the test data, and the time-domain ESNR and/or ESTDR measurements are made of the test track and the reference track, at predetermined time intervals. Later, the time-domain ESNR and ESTDR measurements are analyzed to determine the thermal decay of the data written. In another embodiment of the present invention, the ESNR and/or ESTDR measurements includes reading the data through a non-return-to-zero bus in phases, in which the phases are selected in sequence.