The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 24, 2007
Filed:
Jun. 20, 2005
Jefferson E. Odhner, Amherst, NH (US);
Jefferson E. Odhner, Amherst, NH (US);
Luckoff Display Corporation, Columbus, OH (US);
Abstract
The present invention is directed to apparatus and method for measuring the spectral characteristics of an object surface. The apparatus comprises a light source for generating an input signal comprising a plurality of wavelengths of energy and a diffraction grating for diffracting the input signal into a plurality of diffracted wavelengths of energy. A resonant mirror assembly associated with the diffraction grating sequentially directs a select diffracted wavelength to the object surface to generate a corresponding reflected wavelength of energy. The apparatus further comprises a sensor for determining each select diffracted wavelength of energy directed to the object surface and a detector for detecting one or more of the reflected wavelengths. The detector is coupled with the sensor for associating each select diffracted wavelength with each corresponding reflected wavelength.