The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 24, 2007
Filed:
Feb. 25, 2005
Tadashi Kajino, Okazaki, JP;
Tadashi Kajino, Okazaki, JP;
Nidek Co., Ltd., Gamagori-shi, JP;
Abstract
A lens meter obtaining 0D-reference-coordinates of target-images not detected in a reference state and measuring even progressive lenses, has a lens rest, an optical system having an optical axis, a light source, measurement targets and a photo-sensor, a part calculating optical characteristics based on coordinates-change of target-images in a measurement state with the lens on the rest and axis from those in a reference state without the lens thereon, and an information memory. The part makes the memory store image-coordinates not detected in the reference state obtained during assembly/adjustment, and based on image-coordinates detected in the reference state after power application and before measurement and stored coordinates, obtains image-coordinates not detected in the reference state after power application and before measurement, and calculates characteristics based on coordinates-change of target-images detected in the measurement state from those detected in the reference state before measurement and obtained image-coordinates.