The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 24, 2007
Filed:
Nov. 14, 2005
Matthew S Hull, Dublin, VA (US);
Joshua P Averett, Radford, VA (US);
Mark E Jones, Sequim, WA (US);
Daniel R Klemer, Lexington, KY (US);
Matthew S Hull, Dublin, VA (US);
Joshua P Averett, Radford, VA (US);
Mark E Jones, Sequim, WA (US);
Daniel R Klemer, Lexington, KY (US);
Luna Innovations Incorporated, Blacksburg, VA (US);
Abstract
A device and method for measuring optical properties of a sample are provided. The device comprises a housing surrounding a flow-through flow-cell having a sample inlet positioned proximate to a first end of the flow-cell and a sample outlet positioned proximate to a second end of the flow-cell and a sample chamber positioned between the sample inlet and the sample outlet. A plurality of excitation sources are positioned on the housing and are incident on a sample in the flow-cell. At least one excitation source has a wavelength that is different from the other excitation sources. At least one fluorescence emission detector, which detects a continuous broadband spectrum of emission wavelengths, is positioned in an operable relationship to the flow-cell. At least one signal interrogation system, which interprets a continuous fluorescence emission spectrum, is positioned in an operable relationship with each detector.