The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 24, 2007
Filed:
Mar. 01, 2005
Myron J. Schneider, Ft. Collins, CO (US);
Kenneth P. Parker, Ft. Collins, CO (US);
Chris R. Jacobsen, Ft. Collins, CO (US);
Myron J. Schneider, Ft. Collins, CO (US);
Kenneth P. Parker, Ft. Collins, CO (US);
Chris R. Jacobsen, Ft. Collins, CO (US);
Agilent Technologies, Inc., Santa Clara, CA (US);
Abstract
A method for testing for a defect condition on a node-under-implicit-test of an electrical device is presented. The technique according to the invention includes stimulating a first node of the electrical device that is capacitively coupled to the node-under-implicit-test with a known source signal, and capacitively sensing a signal on a second node of the electrical device that is capacitively coupled to the node-under-implicit-test. A defect condition such as a short or open can be determined from the capacitively sensed signal.