The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 24, 2007
Filed:
May. 04, 2005
Applicants:
Zahid F. Mian, Loudonville, NY (US);
Jeremy C. Mullaney, Troy, NY (US);
Ryk E. Spoor, Troy, NY (US);
Inventors:
Zahid F. Mian, Loudonville, NY (US);
Jeremy C. Mullaney, Troy, NY (US);
Ryk E. Spoor, Troy, NY (US);
Assignee:
International Electronic Machines Corp., Albany, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 5/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A non-visible radiation imaging system is provided in which an image is obtained based on non-visible radiation of an object. The image can be enhanced to increase its resolution. Additionally, the image can be combined with another image based on visible light for the object. Further, a non-visible radiation inspection system and method are provided that perform an inspection of the object using one or more of the images.