The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 24, 2007

Filed:

May. 04, 2005
Applicants:

Zahid F. Mian, Loudonville, NY (US);

Jeremy C. Mullaney, Troy, NY (US);

Ryk E. Spoor, Troy, NY (US);

Inventors:

Zahid F. Mian, Loudonville, NY (US);

Jeremy C. Mullaney, Troy, NY (US);

Ryk E. Spoor, Troy, NY (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 5/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A non-visible radiation imaging system is provided in which an image is obtained based on non-visible radiation of an object. The image can be enhanced to increase its resolution. Additionally, the image can be combined with another image based on visible light for the object. Further, a non-visible radiation inspection system and method are provided that perform an inspection of the object using one or more of the images.


Find Patent Forward Citations

Mian, Zahid. (2007). Non-visible radiation imaging and inspection (U.S. Patent No. 7208733). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7208733

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…