The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 17, 2007
Filed:
May. 07, 2002
Hans-christoph Ostendorf, Munich, DE;
Hans-Christoph Ostendorf, Munich, DE;
Infineon Technologies AG, Munich, DE;
Abstract
A method and an apparatus provides for calibrating a test system for an integrated semiconductor circuit, a pattern generator of the test system generating a test signal in the form of a pattern of successive rising and falling edges, which is composed of superposed sub-patterns formed via different internal paths of the pattern generator. The pattern generator provides an information signal for a measuring device of the test system, which identifies the edges of at least one sub-pattern of the test signal with regard to their origin from one of the internal paths. The calibration is carried out for the internal path separately using the information signal.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile