The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 17, 2007
Filed:
Sep. 23, 2002
Darpan Dinker, San Jose, CA (US);
Pramod Gopinath, Union City, CA (US);
Mahesh Kannan, San Jose, CA (US);
Darpan Dinker, San Jose, CA (US);
Pramod Gopinath, Union City, CA (US);
Mahesh Kannan, San Jose, CA (US);
Sun Microsystems, Inc., Santa Clara, CA (US);
Abstract
Data stored within a cluster may be distributed among nodes each storing a portion of the data. The data may be replicated wherein different nodes store copies of the same portion of the data. In response to detecting the failure of a node, the cluster may initiate a timeout period. If the node remains failed throughout the timeout period, the cluster may copy the portion of the data stored on the failed node onto one or more other nodes of the cluster. If the node returns to the cluster during the timeout period, the cluster may maintain the copy of the data on the previously failed node without copying the portion of the data stored on the failed node onto any other nodes. By delaying self-healing of the cluster for the timeout period, an unbalanced data distribution may be avoided in cases where a failed node quickly rejoins the cluster.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile