The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 17, 2007
Filed:
Sep. 28, 2001
Takahiro Tsukishima, Zushi, JP;
Tateo Shimizu, Owari-asahi, JP;
Takahiro Tsukishima, Zushi, JP;
Tateo Shimizu, Owari-asahi, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
The present invention provides a technique of assisting in forming plans of measures for management reforms, which are specific to an individual enterprise, and a technique of verifying formed plans of measures. In the present invention, a general business-operation-index vector f that includes a plurality of indexes indicating the condition of business management; a general plan-of-measures vector x including a plurality of plans of measures which are information about how to deal with the condition indicated by each index included in the general business-operation-index vector f; and a problem-index vector f', are used. On the basis of these, a problem-index-plan-of-measures matrix Mm′ is produced which defines correlation between the problem-index vector f′ and a plan-of-measures vector x′ (Step). A potential plan-of-measures vector x′ is selected from the general plan-of-measures vector X by extracting the plans of measures in the column of the matrix Mm′ (Step). A gross-investment (necessary to execute plans of measures) matrix Mi is produced (Step). A relational expression between the problem indexes and the plane-of-measures (f′=Mm′·x′) are produced Step).
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile