The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 17, 2007
Filed:
Apr. 03, 2006
Applicants:
Sebastian Sattler, München, DE;
Heinz Mattes, München, DE;
Inventors:
Sebastian Sattler, München, DE;
Heinz Mattes, München, DE;
Assignee:
Infineon Technologies AG, Munich, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 27/28 (2006.01);
U.S. Cl.
CPC ...
Abstract
A semiconductor component is tested by providing a tester, a loadboard and an evaluation apparatus. The semiconductor component is operated using a test sequence, with the reference signal being applied to the semiconductor component or to the evaluation apparatus.
Quick Actions:
Sattler, Sebastian. (2007). Test apparatus and test method for mixed-signal semiconductor components (U.S. Patent No. 7206712). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7206712
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile