The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 17, 2007
Filed:
Jan. 14, 2005
Zhengrong Zhou, Santa Rosa, CA (US);
Mike Millhaem, Santa Rosa, CA (US);
Zhengrong Zhou, Santa Rosa, CA (US);
Mike Millhaem, Santa Rosa, CA (US);
Verigy Pte. Ltd., Singapore, SG;
Abstract
In one embodiment, a request to perform a calibration process for automated test equipment (ATE) is received. The request is associated with a calibration parameter set. After receiving the request, one or more signatures for calibration data corresponding to the calibration parameter set are derived, and a determination is made as to whether calibration data corresponding to the signature(s) has already been generated. Thereafter, an incremental set of calibration data is generated, with the generated calibration data i) corresponding to the signature(s), but ii) not having already been generated. In another embodiment, a request to perform a calibration process for ATE is received, and the request is associated with specified test setups. An incremental set of calibration data corresponding to the specified test setups is then generated.