The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 17, 2007
Filed:
Aug. 20, 2003
Serkan Hatipoglu, Santa Clara, CA (US);
Serkan Hatipoglu, Santa Clara, CA (US);
Eastman Kodak Company, Rochester, NY (US);
Abstract
Wavelet-based denoising is provided to an image. A corrected reference image is acquired and stored. A test image is adjusted using a selected gain setting such that the mean pixel value of the adjusted test image matches the mean pixel value of the reference image. The adjusted image is decomposed into sub-bands using a wavelet transformation. Thresholding is applied to a selected sub-band with a selected threshold setting. An inverse wavelet transformation is then applied to the sub-bands to provide a denoised image. This process is repeated such that each sub-band is tested with multiple threshold settings. The denoised images are analyzed to locate a threshold setting that is approximately optimal for each sub-band. This process is repeated for multiple light settings. A gain-threshold map is constructed by mapping each selected gain setting to the approximately optimal threshold settings for each sub-band at the selected gain setting.