The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 17, 2007
Filed:
Nov. 04, 2004
Todd F. Blalock, Penfield, NY (US);
Todd F. Blalock, Penfield, NY (US);
Lumetrics, Inc., W. Henrietta, NY (US);
Abstract
A system and method for measuring the thickness of materials and coatings across a moving length of material such as sheet, film, or web by the use of non-contact optical interferometry is provided. Also, a system and method for evaluating the seal integrity in flexible packaging across a moving web by the use of non-contact optical interferometry is provided. Measurement of optical density and thickness, and the combination of various measurements in the production and process of manufacturing materials such as flexible packaging items that involve moving webs of material is disclosed. The present invention concerns the system and method involved in the collection and interpretation of data for these measurements and inspections.