The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7205165 B1

PDF
Full Text
Expired
Date of Patent:
Apr. 17, 2007

Filed:

Sep. 18, 2003
Applicants:

Akram Ali Salman, Sunnyvale, CA (US);

Xuejun Zhao, Sunnyvale, CA (US);

Kurt O. Taylor, San Jose, CA (US);

Stephen G. Beebe, Mountain View, CA (US);

Inventors:

Akram Ali Salman, Sunnyvale, CA (US);

Xuejun Zhao, Sunnyvale, CA (US);

Kurt O. Taylor, San Jose, CA (US);

Stephen G. Beebe, Mountain View, CA (US);

Assignee:

Advanced Micro Devices, Inc., Austin, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention is generally directed to various methods for determining the reliability of dielectric layers. In one illustrative embodiment, the method comprises providing a device having a dielectric layer, applying a plurality of constant voltage pulses to the device and measuring a current through the dielectric layer after one or more of the constant voltage pulses has been applied.


Find Patent Forward Citations

Salman, Akram. (2007). Method for determining the reliability of dielectric layers (U.S. Patent No. 7205165). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7205165

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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