The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 10, 2007

Filed:

May. 08, 2003
Applicants:

Nalledath P. Vinodkrishnan, Overland Park, KS (US);

Thomas C. Gifford, Kansas City, MO (US);

Lavanya Srinivasan, Overland Park, KS (US);

Courtlan Telford, Overland Park, KS (US);

Inventors:

Nalledath P. Vinodkrishnan, Overland Park, KS (US);

Thomas C. Gifford, Kansas City, MO (US);

Lavanya Srinivasan, Overland Park, KS (US);

Courtlan Telford, Overland Park, KS (US);

Assignee:

Sprint Communications Company L.P., Overland Park, KS (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01);
U.S. Cl.
CPC ...
Abstract

A selected scenario of a design ICD document for an integrated enterprise is validated by examining each IDL call of each sequence diagram forming part of the selected scenario. A list of data attributes contained in one or more of the IDL calls are generated and each IDL call associated therewith is generated. A physical location to which each such IDL call is mapped is then associated with the IDL call. By analyzing the IDL calls and associated physical locations on a data attribute-by-data attribute basis, inconsistencies in the physical mapping of the data attributes to the databases forming an IIS for the integrated enterprise may be identified and subsequently corrected.


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