The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 10, 2007
Filed:
Aug. 31, 2004
Shai Fine, Ra'anana, IL;
Avi Ziv, Haifa, IL;
International Business Machines Corporation, Armonk, NY (US);
Abstract
A coverage-directed test generation technique for functional design verification relies on events that are clustered according to similarities in the way that the events are stimulated in a simulation environment, not necessarily related to the semantics of the events. The set of directives generated by a coverage-directed test generation engine for each event is analyzed and evaluated for similarities with sets of directives for other events. Identified similarities in the sets of directives provide the basis for defining event clusters. Once clusters have been defined, a common set of directives for the coverage-directed test generation engine is generated that attempts to cover all events in a given cluster.