The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 10, 2007
Filed:
Aug. 31, 2004
Sassan Tabatabaei, Sunnyvale, CA (US);
Mordechai Ben-zeev, San Jose, CA (US);
Paul Frederick Miller, San Jose, CA (US);
Sassan Tabatabaei, Sunnyvale, CA (US);
Mordechai Ben-Zeev, San Jose, CA (US);
Paul Frederick Miller, San Jose, CA (US);
Guide Technology, Inc., Sunnyvale, CA (US);
Abstract
Methods for estimating data-dependent jitter (DDJ) from measured samples of a transmitted data signal include a first exemplary step of obtaining a plurality of measurements (e.g., time tags and event counts for selected pulse widths in the data signal). Such measurements may be obtained at predetermined intervals within a transmitted signal or may be obtained at randomly selected intervals, and should yield measurements for each data pulse in a repeating data pattern. An average unit interval value representative of the average bit time of the transmitted signal is determined. Time interval error estimates representative of the timing deviation from each signal edge's measured value relative to its ideal value (determined in part from the calculated average unit interval value) are also determined, as well as a classification for each measured signal edge relative to a corresponding data pulse in the repeating data pattern. DDJ delta lines are then calculated for signal edges of each pulse width in the transmitted data pattern, from which peak-to-peak DDJ values and/or estimates of duty-cycle-distortion (DCD) can be determined.