The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 10, 2007

Filed:

Feb. 23, 2005
Applicants:

Hideto Motomura, Nara, JP;

Katsuhiro Kanamori, Nara, JP;

Yoichi Miyake, Chiba, JP;

Norimichi Tsumura, Chiba, JP;

Toshiya Nakaguchi, Chiba, JP;

Takashi Sugaya, Chiba, JP;

Inventors:

Hideto Motomura, Nara, JP;

Katsuhiro Kanamori, Nara, JP;

Yoichi Miyake, Chiba, JP;

Norimichi Tsumura, Chiba, JP;

Toshiya Nakaguchi, Chiba, JP;

Takashi Sugaya, Chiba, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/32 (2006.01); G06K 9/36 (2006.01);
U.S. Cl.
CPC ...
Abstract

An image feature analysis section performs image feature analysis of an input image to generate an image feature quantity independent from image coordinates. An image content densification section information densifies the image feature quantity to generate a densified image feature quantity. An image generation section generates, based on the densified image feature quantity, an image in which the information content of the input image is densified.


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