The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7203267 B1

PDF
Full Text
Expired
Date of Patent:
Apr. 10, 2007

Filed:

Jun. 30, 2004
Applicants:

Bruno Kristiaan Bernard DE Man, Clifton Park, NY (US);

Samit Kumar Basu, Niskayuna, NY (US);

Jong Chul YE, Clifton Park, NY (US);

Inventors:

Bruno Kristiaan Bernard De Man, Clifton Park, NY (US);

Samit Kumar Basu, Niskayuna, NY (US);

Jong Chul Ye, Clifton Park, NY (US);

Assignee:

General Electric Company, Niskayuna, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A technique is provided for CT reconstruction for use in CT metrology. The boundary based CT reconstruction method includes the steps of initializing a boundary of an object to obtain a boundary estimate, defining a forward model based on the boundary estimate, linearizing the forward model to obtain a system matrix and implementing an iterative image reconstruction process using the system matrix to update the boundary estimate.


Find Patent Forward Citations

De Man, Bruno Kristiaan Bernard. (2007). System and method for boundary estimation using ct metrology (U.S. Patent No. 7203267). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7203267

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