The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 10, 2007

Filed:

Jul. 03, 2003
Applicants:

Yongsam Moon, Cupertino, CA (US);

Gijung Ahn, Sunnyvale, CA (US);

Deog-kyoon Jeong, Seoul, KR;

Inventors:

Yongsam Moon, Cupertino, CA (US);

Gijung Ahn, Sunnyvale, CA (US);

Deog-Kyoon Jeong, Seoul, KR;

Assignee:

Silicon Image, Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04L 7/00 (2006.01); H03L 7/095 (2006.01); H03D 3/24 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of receiving data, in accordance with an embodiment of the present invention, includes the acts of generating a data sampling clock signal and comparing a received clock signal to the data sampling clock signal. The data sampling clock signal is used to sample a data signal into sampled data representing a first zone, a second zone, and a third zone of the data signal. It is then determined which zone of the sampled data has a transition of the data signal and indicating a direction of change for the data sampling clock signal if the first zone or the third zone has the transition.


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