The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 10, 2007
Filed:
Jul. 02, 2002
Takaharu Yamamoto, Kyoto, JP;
Tsuyoshi Okuda, Kyoto, JP;
Takaharu Yamamoto, Kyoto, JP;
Tsuyoshi Okuda, Kyoto, JP;
Dainippon Screen MFG. Co., Ltd., Kyoto, JP;
Abstract
In a patch measurement device, a data storage section stores printed-image data including a control strip on a printed material. Based on the pixel values constituting printed-image data stored in the data storage section, a patch position detection section detects the position of a patch. A color density measurement section measures the color density of the patch whose position has been detected by the patch position detection section. A correlation coefficient ρm between a key pattern x and subject data y which is calculated by a reference mark detection section is represented as ρm=([x]*[y])−([x]*[y]), where [x]*[y] is a sum of multiplication products of corresponding elements of the two matrices. Matrix [x]represents an inverted pattern of the key pattern x. Even if the subject data y is of an unrelated pattern resembling the key pattern x having different signal levels from those of the key pattern x, the resultant correlation coefficient ρm has a small value, thereby indicative of a low correlation. The resultant correlation coefficient ρm also becomes small if the subject data y is that of a solid patch, due to cancellation by a drastic subtraction.